Atomic force microscopy analysis of the surface of the Clareon® intraocular lens

Session Details

Session Title: New IOLs: Material & Preload IOL

Session Date/Time: Monday 24/09/2018 | 08:00-10:30

Paper Time: 09:51

Venue: Room A3, Podium 2

First Author: : M.Teus SPAIN

Co Author(s): :    J. Gros-Otero   S. Ketabi   R. Canones-Zafra   C. Villa-Collar   M. Garcia-Gonzalez        

Abstract Details

Purpose:

To analyze the surface roughness of the Clareon® intraocular lens (IOL) using atomic force microscopy.

Setting:

IMDEA Nanociencia, Clínica Novovisión, Madrid, Spain.

Methods:

We designed an experimental study to measure the surface roughness of a Clareon® IOL. The roughness was evaluated with a JPK NanoWizard II® atomic force microscopy (AFM) device in contact mode, using the Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips. Surface measurements were made on 3 different areas of the central optical zone of the IOL, analyzing areas of 2 x 2μm, 10 x 10 μm and 50 x 50μm. We evaluated the surface roughness using the root-mean-square (RMS) deviation from a perfectly flat surface value, within the analyzed area.

Results:

The roughness of the surface of the Clareon® IOL (evaluated by the RMS deviation from a perfectly flat surface) was: 0.5nm, 0.73nm and 0.76nm in the 2x2 μm, 10x10 μm and in the 50x50 μm areas, respectively.

Conclusions:

We have found that the roughness of the surface of the Clareon® IOL optical area is smaller than 1 nanometer (RMS), which is far better than the values reported in the literature for other acrylic IOLs.

Financial Disclosure:

... travel has been funded, fully or partially, by a competing company