Atomic force microscopy analysis of the surface of the Clareon® intraocular lens
Session Details
Session Title: New IOLs: Material & Preload IOL
Session Date/Time: Monday 24/09/2018 | 08:00-10:30
Paper Time: 09:51
Venue: Room A3, Podium 2
First Author: : M.Teus SPAIN
Co Author(s): : J. Gros-Otero S. Ketabi R. Canones-Zafra C. Villa-Collar M. Garcia-Gonzalez
Abstract Details
Purpose:
To analyze the surface roughness of the Clareon® intraocular lens (IOL) using atomic force microscopy.
Setting:
IMDEA Nanociencia, Clínica Novovisión, Madrid, Spain.
Methods:
We designed an experimental study to measure the surface roughness of a Clareon® IOL. The roughness was evaluated with a JPK NanoWizard II® atomic force microscopy (AFM) device in contact mode, using the Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips. Surface measurements were made on 3 different areas of the central optical zone of the IOL, analyzing areas of 2 x 2μm, 10 x 10 μm and 50 x 50μm. We evaluated the surface roughness using the root-mean-square (RMS) deviation from a perfectly flat surface value, within the analyzed area.
Results:
The roughness of the surface of the Clareon® IOL (evaluated by the RMS deviation from a perfectly flat surface) was: 0.5nm, 0.73nm and 0.76nm in the 2x2 μm, 10x10 μm and in the 50x50 μm areas, respectively.
Conclusions:
We have found that the roughness of the surface of the Clareon® IOL optical area is smaller than 1 nanometer (RMS), which is far better than the values reported in the literature for other acrylic IOLs.
Financial Disclosure:
... travel has been funded, fully or partially, by a competing company