Posters

Atomic force microscopy analysis of the surface roughness of posterior-chamber phakic IOLs

Poster Details

First Author: M.Teus SPAIN

Co Author(s):    R. Cañones-Zafra   J. Gros-Otero   M. Garcia-Gonzalez   S. Ketabi   C. Villa-Collar   A. Katsanos     

Abstract Details

Purpose:

To measure the surface roughness of two different hydrophilic IOLs in fully hydrated state. The ICL® (Staar) and the IPCL® V2.0 (Care Group, India) phakic IOLs were analyzed.

Setting:

Novovisión clinic and Universidad Europea de Madrid

Methods:

We designed an experimental study to measure the surface roughness of the IOLs. The roughness was evaluated with a JPK NanoWizard II® atomic force microscopy (AFM) device, in “contact mode,” using the Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips. Surface measurements were made on 5 different areas of the central optical zone of each IOL, analyzing an area of 10 x 10 μm. Two different IOLs were analized. The Staar ICL® and the Care Group IPCL V2.0®. Two samples of each IOL were analyzed by the same masked technician.

Results:

The roughness of the IOL optical area (evaluated by the RMS deviation from a perfectly flat surface, in nanometers) were: 3.5±0.5, and 6.1±1.2 nanometers for the IPCL and the ICL, respectively. The difference found was statistically significant (p<0.05).

Conclusions:

AFM is a useful tool to measure the roughness of IOLs. There is a significant difference in the amount of roughness in the different phakic IOLs analyzed. Surface roughness might be relevant for the optical behavior of the IOL as well as for the tolerance to iris and lens capsule rubbing.

Financial Disclosure:

None