Analysis of the surface roughness of six different hydrophobic IOLs with atomic force microscopy

Session Details

Session Title: Monofocal IOLs: New Biomaterials & Visual Performance

Session Date/Time: Tuesday 17/09/2019 | 16:30-18:00

Paper Time: 16:36

Venue: Free Paper Forum: Podium 2

First Author: : R.Canones SPAIN

Co Author(s): :    M. Teus   J. Gros-Otero   M. Garcia-Gonzalez   S. Casado   S. Ketabi   C. Villa              

Abstract Details

Purpose:

To measure the surface roughness of six different hydrophobic IOLs in fully hydrated state, and to compare the roughness (RMS in nanometers) with the previously reported light scatter “surface haze” at the anterior surface of the same IOLs.

Setting:

Clínica Novovisión, Madrid, Spain. Clínica Rementería, Madrid, Spain. Universidad Europea de Madrid, Madrid, Spain. Príncipe de Asturias Hospital, University of Alcalá, Alcalá de Henares, Madrid, Spain.

Methods:

We designed an experimental study to measure the surface roughness of IOLs. The roughness was evaluated with a JPK NanoWizard II® atomic force microscopy (AFM) device, in “contact mode,” using the Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips. Surface measurements were made on 5 different areas of the central optical zone of each IOL, analyzing an area of 10 x 10 μm. Six different IOLs were analized. Tecnis Optiblue® (Johnson and Johnson), EnVista® (Bausch & Lomb) Tecnis® (Johnson & Johnson), Vivinex® (Hoya), Eternity® (Santen) and Clareon® (Alcon). Two samples of each IOL were analyzed by the same masked technician.

Results:

The roughness of the IOL optical area (evaluated by the RMS deviation from a perfectly flat surface, in nanometers) were: 4.39±0.38, 3.83±0.27, 2.41±0.30, 1.30±0.47, 4.39±0.29 and 0.53±0.11, for the Tecnis Optiblue, EnVista, Tecnis, Vivinex, Eternity and Clareon, respectively. The Clareon IOL showed lower roughness than all other IOLs, and this difference was statistically significant (P <0.05). The Spearman correlation coefficient between these roughness values and the previously reported “surface haze” for the same IOLs was 0.88 (P=0.005).

Conclusions:

AFM is a useful tool to measure the roughness of IOLs. There is a significant difference in the amount of roughness in different pseudophakic IOLs, and the values of roughness obtained (RMS in nanometers) do show a high correlation with the light scatter at the surface of the optic area of the IOL.

Financial Disclosure:

None