Posters

Analyzing surface roughness parameter of different IOL materials using atomic force microscopy: an indispensible tool for the evaluation of tendency towards posterior capsular opacification

Poster Details

First Author: P.Biswas INDIA

Co Author(s):    A. Paul   D. Unnikrishnan   P. Biswas   K. Chowdhury   S. Jana   N. Chandak     

Abstract Details

Purpose:

To analyze surface roughness parameters of different IOL models using Atomic Force Microscopy (AFM), Model-CPII (Veeco) and relate with tendency towards posterior capsular opacification. To analyze AFM for obtaining high-resolution imaging of IOL optic surface characteristics. To analyze the variation of surface topography of IOLs with different manufacturing processes and biomaterials.

Setting:

BBEye Foundation, Kolkata and School of Medical Science & Technology, Indian Institute of Technology, Kharagpur, India

Methods:

Double blinded study conducted from November 2007 to April 2008. Eighteen different IOL models (two different temporally separated batches of each model) were included in the study and their posterior surfaces analyzed using AFM, Model-CPII (Veeco). Surface roughness parameters were analyzed Topological data were analyzed using Image Processing and Data Analysis software (version 2.1.15; copyright TM Microscopes USA). Roughness parameters were compared. All the models of a specific material were taken collectively and the level of significance was compared with the other remaining five materials.

Results:

The root mean square roughness(Rq) of the IOL surface is significantly different between various materials. The roughness of same class of IOLs, from different manufacturers, varies possibly due to the different manufacturing processes involved. HEMA IOLs have similar roughness parameters as PMMA IOLs(Rq 6.36 vs 5.974) Silicone IOLs have roughness parameters(Rq 3.582) lower than PMMA and HEMA IOLs but higher than most Acrylic Hydrophobic IOLs(Rq 2.2). Overall most acrylic IOLs have lower roughness parameters than the other group of IOLs. The Rq and Average roughness(Ra) values of Acrylic Hydrophilic IOLs appear higher than others (P value < 0.001).

Conclusions:

Atomic Force Microscopy can accurately measure various roughness parameters of the commercially available IOLs. It will be an essential tool for the roughness parameter assessment and quality control of current IOLs as well as the newly developed IOLs.

Financial Disclosure:

NONE